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섹터 · 반도체 · 2026년 7월 29일

DOE report ET-09: etch pressure 탓한 split-lot, 다른 것을 증명

Factor table·wafer map·confirmation lot이 process change causal 여부를 가른다—semiconductor experiment report이지, ion-implant dose chain·wet-bath notebook·High-NA stitching program 아님.

DOE report ET-09: etch pressure 탓한 split-lot, 다른 것을 증명

Report ID: ET-09
Tool: Etch chamber family C(익명)
Symptom: “Pressure tweak” 후 CD mean shift + edge-heavy map
Format: Designed experiment write-up. Brainstorming slide 아님.


1. Objective

Chamber pressure setpoint(±8%)가 CD shift를 설명하는지, RF hours / season kit / ESC temperature가 dominate하는지.


2. Factors(coded)

| Factor | − | + | Notes | | --- | --- | --- | --- | | A Pressure | −8% | +8% | Contested knob | | B RF hours bucket | Low | High | Same chamber | | C ESC temp | Nom | +3°C | Often ignored |

Short-loop wafer full factorial 2³; then product-like stack confirmation.


3. Results(compressed)

Main effect A(pressure) small.
Main effect B(RF hours) large.
Edge die B×C interaction visible.

Pressure narrative failed. Consumable/seasoning narrative held.

DOE cell 간 wafer map comparison

Pressure에 대한 loud opinion은 main effect 아님.


4. Confirmation lot

Nominal pressure high RF-hours chamber가 defect signature reproduce.
+8% pressure low RF-hours chamber는 did not.

Decision: pressure tribal fix freeze; RF-hour gate로 kit/season playbook trigger.


5. What we almost did wrong

  • All chambers pressure “golden match”로 변경.
  • No split lot.
  • No coded factors.
  • MES note: “optimized.”

That path는 next PM에서 서로 싸우는 tribal recipe invent.

Etch bay에 print·tape된 DOE factor table

Coded 아니면 experiment 아님—mood.


6. Actions

| Action | Owner | | --- | --- | | RF-hour threshold → auto advisory | Equipment | | Run card ESC temp logging mandatory | Process | | Pressure change ET-style DOE ID required | Process + Yield | | ET-09 maps in QMS close | Yield |


Adjacent fences

Ion-implant dose walk는 Faraday chain. Wet-bath notebook은 titration lifetime. High-NA stitching은 litho seam. AMC hunt는 airborne chemistry. ET-09는 etch rumor causal honesty. One ugly map으로 all chamber retune 마라.


Sign-off

Process ____ Equipment ____ Yield ____

Three signature 없으면 ET-09는 PDF, control 아님.

같은 섹터의 다른 분석